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Enhancing sensitivity in atomic force microscopy for planar tip-on-chip probes
We present a new approach to tuning-fork-based atomic force microscopy for utilizing advanced “tip-on-chip” probes with high sensitivity and broad compatibility. Usually, such chip-like probes with a size reaching 2 × 2 mm(2) drastically perturb the oscillation of the tuning fork, resulting in poor...
| Autores principales: | , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group UK
2022
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9108095/ https://www.ncbi.nlm.nih.gov/pubmed/35586140 http://dx.doi.org/10.1038/s41378-022-00379-x |