SPIE Computer-Aided Diagnosis conference anniversary review

The SPIE Computer-Aided Diagnosis conference has been held for 16 consecutive years at the annual SPIE Medical Imaging symposium. The conference remains vibrant, with a core group of submitters as well as new submitters and attendees each year. Recent developments include a marked shift in submissio...

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Detalles Bibliográficos
Autores principales: Summers, Ronald M., Giger, Maryellen L.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Society of Photo-Optical Instrumentation Engineers 2022
Materias:
Special Issue Celebrating 50 Years of SPIE Medical Imaging
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9119306/
https://www.ncbi.nlm.nih.gov/pubmed/35607354
http://dx.doi.org/10.1117/1.JMI.9.S1.012208

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9119306/
https://www.ncbi.nlm.nih.gov/pubmed/35607354
http://dx.doi.org/10.1117/1.JMI.9.S1.012208

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