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SPIE Computer-Aided Diagnosis conference anniversary review

The SPIE Computer-Aided Diagnosis conference has been held for 16 consecutive years at the annual SPIE Medical Imaging symposium. The conference remains vibrant, with a core group of submitters as well as new submitters and attendees each year. Recent developments include a marked shift in submissio...

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Detalles Bibliográficos
Autores principales: Summers, Ronald M., Giger, Maryellen L.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Society of Photo-Optical Instrumentation Engineers 2022
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9119306/
https://www.ncbi.nlm.nih.gov/pubmed/35607354
http://dx.doi.org/10.1117/1.JMI.9.S1.012208
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author Summers, Ronald M.
Giger, Maryellen L.
author_facet Summers, Ronald M.
Giger, Maryellen L.
author_sort Summers, Ronald M.
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description The SPIE Computer-Aided Diagnosis conference has been held for 16 consecutive years at the annual SPIE Medical Imaging symposium. The conference remains vibrant, with a core group of submitters as well as new submitters and attendees each year. Recent developments include a marked shift in submissions relating to the artificial intelligence revolution in medical image analysis. This review describes the topics and trends observed in research presented at the Computer-Aided Diagnosis conference as part of the 50th-anniversary celebration of SPIE Medical Imaging.
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spelling pubmed-91193062023-05-19 SPIE Computer-Aided Diagnosis conference anniversary review Summers, Ronald M. Giger, Maryellen L. J Med Imaging (Bellingham) Special Issue Celebrating 50 Years of SPIE Medical Imaging The SPIE Computer-Aided Diagnosis conference has been held for 16 consecutive years at the annual SPIE Medical Imaging symposium. The conference remains vibrant, with a core group of submitters as well as new submitters and attendees each year. Recent developments include a marked shift in submissions relating to the artificial intelligence revolution in medical image analysis. This review describes the topics and trends observed in research presented at the Computer-Aided Diagnosis conference as part of the 50th-anniversary celebration of SPIE Medical Imaging. Society of Photo-Optical Instrumentation Engineers 2022-05-19 2022-02 /pmc/articles/PMC9119306/ /pubmed/35607354 http://dx.doi.org/10.1117/1.JMI.9.S1.012208 Text en © 2022 The Authors https://creativecommons.org/licenses/by/4.0/Published by SPIE under a Creative Commons Attribution 4.0 International License. Distribution or reproduction of this work in whole or in part requires full attribution of the original publication, including its DOI.
spellingShingle Special Issue Celebrating 50 Years of SPIE Medical Imaging
Summers, Ronald M.
Giger, Maryellen L.
SPIE Computer-Aided Diagnosis conference anniversary review
title SPIE Computer-Aided Diagnosis conference anniversary review
title_full SPIE Computer-Aided Diagnosis conference anniversary review
title_fullStr SPIE Computer-Aided Diagnosis conference anniversary review
title_full_unstemmed SPIE Computer-Aided Diagnosis conference anniversary review
title_short SPIE Computer-Aided Diagnosis conference anniversary review
title_sort spie computer-aided diagnosis conference anniversary review
topic Special Issue Celebrating 50 Years of SPIE Medical Imaging
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9119306/
https://www.ncbi.nlm.nih.gov/pubmed/35607354
http://dx.doi.org/10.1117/1.JMI.9.S1.012208
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