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SPIE Computer-Aided Diagnosis conference anniversary review
The SPIE Computer-Aided Diagnosis conference has been held for 16 consecutive years at the annual SPIE Medical Imaging symposium. The conference remains vibrant, with a core group of submitters as well as new submitters and attendees each year. Recent developments include a marked shift in submissio...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Society of Photo-Optical Instrumentation Engineers
2022
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9119306/ https://www.ncbi.nlm.nih.gov/pubmed/35607354 http://dx.doi.org/10.1117/1.JMI.9.S1.012208 |