Residual stress analysis of thin film photovoltaic cells subjected to massive micro-particle impact

Residual stresses play a crucial role in both light-electricity conversion performances and the lifespan of photovoltaic (PV) cells. In this paper, the residual stress of triple junction cells (i.e. GaInP/GaInAs/Ge) induced by laser-driven massive micro-particle impact is analyzed with a novel metho...

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Detalles Bibliográficos
Autores principales: Xiao, Kailu, Wu, Xianqian, Wu, Chenwu, Yin, Qiuyun, Huang, Chenguang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: The Royal Society of Chemistry 2020
Materias:
Chemistry
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9122580/
https://www.ncbi.nlm.nih.gov/pubmed/35692739
http://dx.doi.org/10.1039/c9ra10082b

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9122580/
https://www.ncbi.nlm.nih.gov/pubmed/35692739
http://dx.doi.org/10.1039/c9ra10082b

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