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Novel High Isolation and High Capacitance Ratio RF MEMS Switch: Design, Analysis and Performance Verification

In this paper, a novel high isolation and high-capacitance-ratio radio-frequency micro-electromechanical systems (RF MEMS) switch working at Ka-band is designed, fabricated, measured and analyzed. The proposed RF MEMS switch mainly consists of a MEMS metallic beam, coplanar waveguide (CPW) transmiss...

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Detalles Bibliográficos
Autores principales: Deng, Zhongliang, Wang, Yucheng, Deng, Kun, Lai, Chengqi, Zhou, Jiali
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2022
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9147631/
https://www.ncbi.nlm.nih.gov/pubmed/35630113
http://dx.doi.org/10.3390/mi13050646
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author Deng, Zhongliang
Wang, Yucheng
Deng, Kun
Lai, Chengqi
Zhou, Jiali
author_facet Deng, Zhongliang
Wang, Yucheng
Deng, Kun
Lai, Chengqi
Zhou, Jiali
author_sort Deng, Zhongliang
collection PubMed
description In this paper, a novel high isolation and high-capacitance-ratio radio-frequency micro-electromechanical systems (RF MEMS) switch working at Ka-band is designed, fabricated, measured and analyzed. The proposed RF MEMS switch mainly consists of a MEMS metallic beam, coplanar waveguide (CPW) transmission line, dielectric layer and metal–insulator–metal (MIM) fixed capacitors. The measured results indicate that the insertion loss is better than 0.5 dB at 32 GHz, and the isolation is more than 35 dB at the resonant frequency. From the fitted results, the capacitance ratio is 246.3. Compared with traditional MEMS capacitive switches, this proposed MEMS switch exhibits a high capacitance ratio and provides a wonderful solution for cutting-edge performance in 5G and other high-performance applications.
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spelling pubmed-91476312022-05-29 Novel High Isolation and High Capacitance Ratio RF MEMS Switch: Design, Analysis and Performance Verification Deng, Zhongliang Wang, Yucheng Deng, Kun Lai, Chengqi Zhou, Jiali Micromachines (Basel) Article In this paper, a novel high isolation and high-capacitance-ratio radio-frequency micro-electromechanical systems (RF MEMS) switch working at Ka-band is designed, fabricated, measured and analyzed. The proposed RF MEMS switch mainly consists of a MEMS metallic beam, coplanar waveguide (CPW) transmission line, dielectric layer and metal–insulator–metal (MIM) fixed capacitors. The measured results indicate that the insertion loss is better than 0.5 dB at 32 GHz, and the isolation is more than 35 dB at the resonant frequency. From the fitted results, the capacitance ratio is 246.3. Compared with traditional MEMS capacitive switches, this proposed MEMS switch exhibits a high capacitance ratio and provides a wonderful solution for cutting-edge performance in 5G and other high-performance applications. MDPI 2022-04-19 /pmc/articles/PMC9147631/ /pubmed/35630113 http://dx.doi.org/10.3390/mi13050646 Text en © 2022 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Deng, Zhongliang
Wang, Yucheng
Deng, Kun
Lai, Chengqi
Zhou, Jiali
Novel High Isolation and High Capacitance Ratio RF MEMS Switch: Design, Analysis and Performance Verification
title Novel High Isolation and High Capacitance Ratio RF MEMS Switch: Design, Analysis and Performance Verification
title_full Novel High Isolation and High Capacitance Ratio RF MEMS Switch: Design, Analysis and Performance Verification
title_fullStr Novel High Isolation and High Capacitance Ratio RF MEMS Switch: Design, Analysis and Performance Verification
title_full_unstemmed Novel High Isolation and High Capacitance Ratio RF MEMS Switch: Design, Analysis and Performance Verification
title_short Novel High Isolation and High Capacitance Ratio RF MEMS Switch: Design, Analysis and Performance Verification
title_sort novel high isolation and high capacitance ratio rf mems switch: design, analysis and performance verification
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9147631/
https://www.ncbi.nlm.nih.gov/pubmed/35630113
http://dx.doi.org/10.3390/mi13050646
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