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Calculating small-angle scattering intensity functions from electron-microscopy images

We outline procedures to calculate small-angle scattering (SAS) intensity functions from 2-dimensional electron-microscopy (EM) images. Two types of scattering systems were considered: (a) the sample is a set of particles confined to a plane; or (b) the sample is modelled as parallel, infinitely lon...

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Detalles Bibliográficos
Autores principales: Yildirim, Batuhan, Washington, Adam, Doutch, James, Cole, Jacqueline M.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: The Royal Society of Chemistry 2022
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9169464/
https://www.ncbi.nlm.nih.gov/pubmed/35754871
http://dx.doi.org/10.1039/d2ra00685e