Application of Three-Repetition Tests Scheme to Improve Integrated Circuits Test Quality to Near-Zero Defect

In this research, the normal distribution is assumed to be the product characteristic, and the DITM (Digital Integrated Circuit Test Model) model is used to evaluate the integrated circuits (IC) test yield and test quality. Testing technology lags far behind manufacturing technology due to the diffe...

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Detalles Bibliográficos
Autores principales: Yeh, Chung-Huang, Chen, Jwu-E
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2022
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9185298/
https://www.ncbi.nlm.nih.gov/pubmed/35684779
http://dx.doi.org/10.3390/s22114158

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9185298/
https://www.ncbi.nlm.nih.gov/pubmed/35684779
http://dx.doi.org/10.3390/s22114158

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