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Signature of weak-antilocalization in sputtered topological insulator Bi(2)Se(3) thin films with varying thickness
We report a low-temperature magneto transport study of Bi(2)Se(3) thin films of different thicknesses (40, 80 and 160 nm), deposited on sapphire (0001) substrates, using radio frequency magnetron sputtering technique. The high-resolution x-ray diffraction measurements revealed the growth of rhombohe...
| Autores principales: | , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group UK
2022
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9192768/ https://www.ncbi.nlm.nih.gov/pubmed/35697762 http://dx.doi.org/10.1038/s41598-022-13600-8 |