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Signature of weak-antilocalization in sputtered topological insulator Bi(2)Se(3) thin films with varying thickness

We report a low-temperature magneto transport study of Bi(2)Se(3) thin films of different thicknesses (40, 80 and 160 nm), deposited on sapphire (0001) substrates, using radio frequency magnetron sputtering technique. The high-resolution x-ray diffraction measurements revealed the growth of rhombohe...

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Detalles Bibliográficos
Autores principales:	Gautam, Sudhanshu, Aggarwal, V., Singh, Bheem, Awana, V. P. S., Ganesan, Ramakrishnan, Kushvaha, S. S.
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Nature Publishing Group UK 2022
Materias:	Article
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9192768/ https://www.ncbi.nlm.nih.gov/pubmed/35697762 http://dx.doi.org/10.1038/s41598-022-13600-8

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