Magnetic force microscopy of an operational spin nano-oscillator

Magnetic force microscopy (MFM) is a powerful technique for studying magnetic microstructures and nanostructures that relies on force detection by a cantilever with a magnetic tip. The detected magnetic tip interactions are used to reconstruct the magnetic structure of the sample surface. Here, we d...

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Autores principales: Banuazizi, Seyed Amir Hossein, Houshang, Afshin, Awad, Ahmad A., Mohammadi, Javad, Åkerman, Johan, Belova, Liubov M.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2022
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9200774/
https://www.ncbi.nlm.nih.gov/pubmed/35721373
http://dx.doi.org/10.1038/s41378-022-00380-4
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author Banuazizi, Seyed Amir Hossein
Houshang, Afshin
Awad, Ahmad A.
Mohammadi, Javad
Åkerman, Johan
Belova, Liubov M.
author_facet Banuazizi, Seyed Amir Hossein
Houshang, Afshin
Awad, Ahmad A.
Mohammadi, Javad
Åkerman, Johan
Belova, Liubov M.
author_sort Banuazizi, Seyed Amir Hossein
collection PubMed
description Magnetic force microscopy (MFM) is a powerful technique for studying magnetic microstructures and nanostructures that relies on force detection by a cantilever with a magnetic tip. The detected magnetic tip interactions are used to reconstruct the magnetic structure of the sample surface. Here, we demonstrate a new method using MFM for probing the spatial profile of an operational nanoscale spintronic device, the spin Hall nano-oscillator (SHNO), which generates high-intensity spin wave auto-oscillations enabling novel microwave applications in magnonics and neuromorphic computing. We developed an MFM system by adding a microwave probe station to allow electrical and microwave characterization up to 40 GHz during the MFM process. SHNOs—based on NiFe/Pt bilayers with a specific design compatible with the developed system—were fabricated and scanned using a Co magnetic force microscopy tip with 10 nm spatial MFM resolution, while a DC current sufficient to induce auto-oscillation flowed. Our results show that this developed method provides a promising path for the characterization and nanoscale magnetic field imaging of operational nano-oscillators. [Image: see text]
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spelling pubmed-92007742022-06-17 Magnetic force microscopy of an operational spin nano-oscillator Banuazizi, Seyed Amir Hossein Houshang, Afshin Awad, Ahmad A. Mohammadi, Javad Åkerman, Johan Belova, Liubov M. Microsyst Nanoeng Article Magnetic force microscopy (MFM) is a powerful technique for studying magnetic microstructures and nanostructures that relies on force detection by a cantilever with a magnetic tip. The detected magnetic tip interactions are used to reconstruct the magnetic structure of the sample surface. Here, we demonstrate a new method using MFM for probing the spatial profile of an operational nanoscale spintronic device, the spin Hall nano-oscillator (SHNO), which generates high-intensity spin wave auto-oscillations enabling novel microwave applications in magnonics and neuromorphic computing. We developed an MFM system by adding a microwave probe station to allow electrical and microwave characterization up to 40 GHz during the MFM process. SHNOs—based on NiFe/Pt bilayers with a specific design compatible with the developed system—were fabricated and scanned using a Co magnetic force microscopy tip with 10 nm spatial MFM resolution, while a DC current sufficient to induce auto-oscillation flowed. Our results show that this developed method provides a promising path for the characterization and nanoscale magnetic field imaging of operational nano-oscillators. [Image: see text] Nature Publishing Group UK 2022-06-15 /pmc/articles/PMC9200774/ /pubmed/35721373 http://dx.doi.org/10.1038/s41378-022-00380-4 Text en © The Author(s) 2022 https://creativecommons.org/licenses/by/4.0/Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/ (https://creativecommons.org/licenses/by/4.0/) .
spellingShingle Article
Banuazizi, Seyed Amir Hossein
Houshang, Afshin
Awad, Ahmad A.
Mohammadi, Javad
Åkerman, Johan
Belova, Liubov M.
Magnetic force microscopy of an operational spin nano-oscillator
title Magnetic force microscopy of an operational spin nano-oscillator
title_full Magnetic force microscopy of an operational spin nano-oscillator
title_fullStr Magnetic force microscopy of an operational spin nano-oscillator
title_full_unstemmed Magnetic force microscopy of an operational spin nano-oscillator
title_short Magnetic force microscopy of an operational spin nano-oscillator
title_sort magnetic force microscopy of an operational spin nano-oscillator
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9200774/
https://www.ncbi.nlm.nih.gov/pubmed/35721373
http://dx.doi.org/10.1038/s41378-022-00380-4
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