Nanoscale defect evaluation framework combining real-time transmission electron microscopy and integrated machine learning-particle filter estimation

Observation of dynamic processes by transmission electron microscopy (TEM) is an attractive technique to experimentally analyze materials’ nanoscale phenomena and understand the microstructure-properties relationships in nanoscale. Even if spatial and temporal resolutions of real-time TEM increase s...

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Detalles Bibliográficos
Autores principales: Sasaki, K., Muramatsu, M., Hirayama, K., Endo, K., Murayama, M.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2022
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9217921/
https://www.ncbi.nlm.nih.gov/pubmed/35732650
http://dx.doi.org/10.1038/s41598-022-13878-8

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9217921/
https://www.ncbi.nlm.nih.gov/pubmed/35732650
http://dx.doi.org/10.1038/s41598-022-13878-8

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