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Nanoscale defect evaluation framework combining real-time transmission electron microscopy and integrated machine learning-particle filter estimation
Observation of dynamic processes by transmission electron microscopy (TEM) is an attractive technique to experimentally analyze materials’ nanoscale phenomena and understand the microstructure-properties relationships in nanoscale. Even if spatial and temporal resolutions of real-time TEM increase s...
Autores principales: | Sasaki, K., Muramatsu, M., Hirayama, K., Endo, K., Murayama, M. |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2022
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9217921/ https://www.ncbi.nlm.nih.gov/pubmed/35732650 http://dx.doi.org/10.1038/s41598-022-13878-8 |
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