XPS Study in BiFeO(3) Surface Modified by Argon Etching

This paper reports an XPS surface study of pure phase BiFeO [Formula: see text] thin film produced and later etched by pure argon ions. Analysis of high-resolution spectra from Fe [Formula: see text] , Bi [Formula: see text] and [Formula: see text] , O [Formula: see text] , and the valence band, exh...

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Detalles Bibliográficos
Autores principales: Gomez-Iriarte, Grecia Alejandra, Pentón-Madrigal, Arbelio, de Oliveira, Luiz Augusto Sousa, Sinnecker, João Paulo
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2022
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9227888/
https://www.ncbi.nlm.nih.gov/pubmed/35744344
http://dx.doi.org/10.3390/ma15124285

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9227888/
https://www.ncbi.nlm.nih.gov/pubmed/35744344
http://dx.doi.org/10.3390/ma15124285

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