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XPS Study in BiFeO(3) Surface Modified by Argon Etching

This paper reports an XPS surface study of pure phase BiFeO [Formula: see text] thin film produced and later etched by pure argon ions. Analysis of high-resolution spectra from Fe [Formula: see text] , Bi [Formula: see text] and [Formula: see text] , O [Formula: see text] , and the valence band, exh...

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Detalles Bibliográficos
Autores principales:	Gomez-Iriarte, Grecia Alejandra, Pentón-Madrigal, Arbelio, de Oliveira, Luiz Augusto Sousa, Sinnecker, João Paulo
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	MDPI 2022
Materias:	Article
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9227888/ https://www.ncbi.nlm.nih.gov/pubmed/35744344 http://dx.doi.org/10.3390/ma15124285

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