Structural and Electrical Properties of Annealed Ge(2)Sb(2)Te(5) Films Grown on Flexible Polyimide

The morphological, structural, and electrical properties of as-grown and annealed Ge(2)Sb(2)Te(5) (GST) layers, deposited by RF-sputtering on flexible polyimide, were studied by means of optical microscopy, atomic force microscopy, X-ray diffraction, Raman spectroscopy, and electrical characterizati...

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Detalles Bibliográficos
Autores principales: Bertelli, Marco, Díaz Fattorini, Adriano, De Simone, Sara, Calvi, Sabrina, Plebani, Riccardo, Mussi, Valentina, Arciprete, Fabrizio, Calarco, Raffaella, Longo, Massimo
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2022
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9228038/
https://www.ncbi.nlm.nih.gov/pubmed/35745340
http://dx.doi.org/10.3390/nano12122001

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9228038/
https://www.ncbi.nlm.nih.gov/pubmed/35745340
http://dx.doi.org/10.3390/nano12122001

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