Time-Varying Pseudorandom Disturbed Pattern Generation Algorithm for Track Circuit Equipment Testing

To improve the test accuracy and fault coverage of high-speed railway-related equipment boards, a time-varying pseudorandom disturbance algorithm based on the automatic test pattern generation technology in chip testing is proposed. The algorithm combines the pseudorandom pattern generation algorith...

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Detalles Bibliográficos
Autores principales: Chen, Xiaoming, Wang, Zhixuan, Yu, Zhiyang, Chui, Hsiang-Chen
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2022
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9229937/
https://www.ncbi.nlm.nih.gov/pubmed/35744467
http://dx.doi.org/10.3390/mi13060853

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9229937/
https://www.ncbi.nlm.nih.gov/pubmed/35744467
http://dx.doi.org/10.3390/mi13060853

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