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Time-Varying Pseudorandom Disturbed Pattern Generation Algorithm for Track Circuit Equipment Testing
To improve the test accuracy and fault coverage of high-speed railway-related equipment boards, a time-varying pseudorandom disturbance algorithm based on the automatic test pattern generation technology in chip testing is proposed. The algorithm combines the pseudorandom pattern generation algorith...
| Autores principales: | , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2022
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9229937/ https://www.ncbi.nlm.nih.gov/pubmed/35744467 http://dx.doi.org/10.3390/mi13060853 |