Special Section Guest Editorial: Hard X-Ray Tomography with Micrometer Resolution

JMI guest editors introduce articles collected in the JMI Special Section on Hard X-Ray Tomography with Micrometer Resolution, a snapshot of this important niche area featured by hard x-ray tomography at the micrometer level.

Detalles Bibliográficos
Autores principales: Müller, Bert, Stock, Stuart R., Wang, Ge, Brankov, Jovan G.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Society of Photo-Optical Instrumentation Engineers 2022
Materias:
Special Section on Hard X-Ray Tomography with Micrometer Resolution
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9243520/
https://www.ncbi.nlm.nih.gov/pubmed/35789705
http://dx.doi.org/10.1117/1.JMI.9.3.031501

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9243520/
https://www.ncbi.nlm.nih.gov/pubmed/35789705
http://dx.doi.org/10.1117/1.JMI.9.3.031501

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