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Special Section Guest Editorial: Hard X-Ray Tomography with Micrometer Resolution
JMI guest editors introduce articles collected in the JMI Special Section on Hard X-Ray Tomography with Micrometer Resolution, a snapshot of this important niche area featured by hard x-ray tomography at the micrometer level.
Autores principales: | , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Society of Photo-Optical Instrumentation Engineers
2022
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9243520/ https://www.ncbi.nlm.nih.gov/pubmed/35789705 http://dx.doi.org/10.1117/1.JMI.9.3.031501 |
_version_ | 1784738330811826176 |
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author | Müller, Bert Stock, Stuart R. Wang, Ge Brankov, Jovan G. |
author_facet | Müller, Bert Stock, Stuart R. Wang, Ge Brankov, Jovan G. |
author_sort | Müller, Bert |
collection | PubMed |
description | JMI guest editors introduce articles collected in the JMI Special Section on Hard X-Ray Tomography with Micrometer Resolution, a snapshot of this important niche area featured by hard x-ray tomography at the micrometer level. |
format | Online Article Text |
id | pubmed-9243520 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2022 |
publisher | Society of Photo-Optical Instrumentation Engineers |
record_format | MEDLINE/PubMed |
spelling | pubmed-92435202023-06-30 Special Section Guest Editorial: Hard X-Ray Tomography with Micrometer Resolution Müller, Bert Stock, Stuart R. Wang, Ge Brankov, Jovan G. J Med Imaging (Bellingham) Special Section on Hard X-Ray Tomography with Micrometer Resolution JMI guest editors introduce articles collected in the JMI Special Section on Hard X-Ray Tomography with Micrometer Resolution, a snapshot of this important niche area featured by hard x-ray tomography at the micrometer level. Society of Photo-Optical Instrumentation Engineers 2022-06-30 2022-05 /pmc/articles/PMC9243520/ /pubmed/35789705 http://dx.doi.org/10.1117/1.JMI.9.3.031501 Text en © 2022 Society of Photo-Optical Instrumentation Engineers (SPIE) |
spellingShingle | Special Section on Hard X-Ray Tomography with Micrometer Resolution Müller, Bert Stock, Stuart R. Wang, Ge Brankov, Jovan G. Special Section Guest Editorial: Hard X-Ray Tomography with Micrometer Resolution |
title | Special Section Guest Editorial: Hard X-Ray Tomography with Micrometer Resolution |
title_full | Special Section Guest Editorial: Hard X-Ray Tomography with Micrometer Resolution |
title_fullStr | Special Section Guest Editorial: Hard X-Ray Tomography with Micrometer Resolution |
title_full_unstemmed | Special Section Guest Editorial: Hard X-Ray Tomography with Micrometer Resolution |
title_short | Special Section Guest Editorial: Hard X-Ray Tomography with Micrometer Resolution |
title_sort | special section guest editorial: hard x-ray tomography with micrometer resolution |
topic | Special Section on Hard X-Ray Tomography with Micrometer Resolution |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9243520/ https://www.ncbi.nlm.nih.gov/pubmed/35789705 http://dx.doi.org/10.1117/1.JMI.9.3.031501 |
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