An Intelligent Fault Diagnosis Based on Adversarial Generating Module and Semi-supervised Convolutional Neural Network

Aiming at the existing problems in machinery monitoring data such as high cost of labeling and lack of typical failure samples, this paper launches a research on the semi-supervised-style intelligent fault diagnosis. Taking a great mount of unlabeled data and only a small quantity of labeled data as...

Descripción completa

Detalles Bibliográficos
Autores principales: Ye, Qing, Liu, Changhua
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Hindawi 2022
Materias:
Research Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9249457/
https://www.ncbi.nlm.nih.gov/pubmed/35785063
http://dx.doi.org/10.1155/2022/1679836

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9249457/
https://www.ncbi.nlm.nih.gov/pubmed/35785063
http://dx.doi.org/10.1155/2022/1679836

Ejemplares similares