Automatic parameter selection for electron ptychography via Bayesian optimization

Electron ptychography provides new opportunities to resolve atomic structures with deep sub-angstrom spatial resolution and to study electron-beam sensitive materials with high dose efficiency. In practice, obtaining accurate ptychography images requires simultaneously optimizing multiple parameters...

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Detalles Bibliográficos
Autores principales: Cao, Michael C., Chen, Zhen, Jiang, Yi, Han, Yimo
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2022
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9296498/
https://www.ncbi.nlm.nih.gov/pubmed/35854039
http://dx.doi.org/10.1038/s41598-022-16041-5

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9296498/
https://www.ncbi.nlm.nih.gov/pubmed/35854039
http://dx.doi.org/10.1038/s41598-022-16041-5

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