Optical emission from focused ion beam milled halide perovskite device cross‐sections

Cross‐sectional transmission electron microscopy has been widely used to investigate organic–inorganic hybrid halide perovskite‐based optoelectronic devices. Electron‐transparent specimens (lamellae) used in such studies are often prepared using focused ion beam (FIB) milling. However, the gallium i...

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Detalles Bibliográficos
Autores principales: Kosasih, Felix U., Divitini, Giorgio, Orri, Jordi Ferrer, Tennyson, Elizabeth M., Kusch, Gunnar, Oliver, Rachel A., Stranks, Samuel D., Ducati, Caterina
Formato: Online Artículo Texto
Lenguaje:English
Publicado: John Wiley & Sons, Inc. 2022
Materias:
Letter
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9304233/
https://www.ncbi.nlm.nih.gov/pubmed/35118749
http://dx.doi.org/10.1002/jemt.24069

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9304233/
https://www.ncbi.nlm.nih.gov/pubmed/35118749
http://dx.doi.org/10.1002/jemt.24069

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