Use of PtC Nanotips for Low-Voltage Quantum Tunneling Applications

The use of focused ion and focused electron beam (FIB/FEB) technology permits the fabrication of micro- and nanometer scale geometries. Therefore, FIB/FEB technology is a favorable technique for preparing TEM lamellae, nanocontacts, or nanowires and repairing electronic circuits. This work investiga...

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Detalles Bibliográficos
Autores principales: Haub, Michael, Guenther, Thomas, Bogner, Martin, Zimmermann, André
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2022
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9317598/
https://www.ncbi.nlm.nih.gov/pubmed/35888836
http://dx.doi.org/10.3390/mi13071019

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9317598/
https://www.ncbi.nlm.nih.gov/pubmed/35888836
http://dx.doi.org/10.3390/mi13071019

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