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Use of PtC Nanotips for Low-Voltage Quantum Tunneling Applications
The use of focused ion and focused electron beam (FIB/FEB) technology permits the fabrication of micro- and nanometer scale geometries. Therefore, FIB/FEB technology is a favorable technique for preparing TEM lamellae, nanocontacts, or nanowires and repairing electronic circuits. This work investiga...
Autores principales: | Haub, Michael, Guenther, Thomas, Bogner, Martin, Zimmermann, André |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2022
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9317598/ https://www.ncbi.nlm.nih.gov/pubmed/35888836 http://dx.doi.org/10.3390/mi13071019 |
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