A script‐based method for achieving distortion‐free selected area electron diffraction

Electron diffraction patterns obtained on a TEM contain elliptical distortion resulting from column defects. This distortion can be corrected by applying offsets to the objective lens stigmators to cancel distortions occurring further down the column. In this work, a DigitalMicrographTM script‐based...

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Detalles Bibliográficos
Autor principal: Mitchell, David R. G.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: John Wiley & Sons, Inc. 2022
Materias:
Research Articles
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9321128/
https://www.ncbi.nlm.nih.gov/pubmed/35397131
http://dx.doi.org/10.1002/jemt.24124

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9321128/
https://www.ncbi.nlm.nih.gov/pubmed/35397131
http://dx.doi.org/10.1002/jemt.24124

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