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A script‐based method for achieving distortion‐free selected area electron diffraction
Electron diffraction patterns obtained on a TEM contain elliptical distortion resulting from column defects. This distortion can be corrected by applying offsets to the objective lens stigmators to cancel distortions occurring further down the column. In this work, a DigitalMicrographTM script‐based...
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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John Wiley & Sons, Inc.
2022
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9321128/ https://www.ncbi.nlm.nih.gov/pubmed/35397131 http://dx.doi.org/10.1002/jemt.24124 |