Cargando…
The Crystalline Structure of Thin Bismuth Layers Grown on Silicon (111) Substrates
Bismuth films with thicknesses between 6 and ∼30 nm were grown on Si (111) substrate by molecular beam epitaxy (MBE). Two main phases of bismuth — [Formula: see text]-Bi and [Formula: see text]-Bi — were identified from high-resolution X-ray diffraction (XRD) measurements. The crystal structure depe...
| Autores principales: | , , , , , |
|---|---|
| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2022
|
| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9323643/ https://www.ncbi.nlm.nih.gov/pubmed/35888313 http://dx.doi.org/10.3390/ma15144847 |