Locating critical events in AFM force measurements by means of one-dimensional convolutional neural networks

Atomic Force Microscopy (AFM) force measurements are a powerful tool for the nano-scale characterization of surface properties. However, the analysis of force measurements requires several processing steps. One is locating different type of events e.g., contact point, adhesions and indentations. At...

Descripción completa

Detalles Bibliográficos
Autores principales: Sotres, Javier, Boyd, Hannah, Gonzalez-Martinez, Juan F.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2022
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9338096/
https://www.ncbi.nlm.nih.gov/pubmed/35906466
http://dx.doi.org/10.1038/s41598-022-17124-z

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9338096/
https://www.ncbi.nlm.nih.gov/pubmed/35906466
http://dx.doi.org/10.1038/s41598-022-17124-z

Ejemplares similares