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Locating critical events in AFM force measurements by means of one-dimensional convolutional neural networks
Atomic Force Microscopy (AFM) force measurements are a powerful tool for the nano-scale characterization of surface properties. However, the analysis of force measurements requires several processing steps. One is locating different type of events e.g., contact point, adhesions and indentations. At...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group UK
2022
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9338096/ https://www.ncbi.nlm.nih.gov/pubmed/35906466 http://dx.doi.org/10.1038/s41598-022-17124-z |