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Enhancement of fatigue resistance by recrystallization and grain growth to eliminate bonding interfaces in Cu–Cu joints

Cu–Cu joints have been adopted for ultra-high density of packaging for high-end devices. However, cracks may form and propagate along the bonding interfaces during fatigue tests. In this study, Cu–Cu joints were fabricated at 300 °C by bonding 〈111〉-oriented nanotwinned Cu microbumps with 30 μm in d...

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Detalles Bibliográficos
Autores principales: Ong, Jia-Juen, Tran, Dinh-Phuc, Lan, Man-Chi, Shie, Kai-Cheng, Hsu, Po-Ning, Tsou, Nien‑Ti, Chen, Chih
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2022
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9338952/
https://www.ncbi.nlm.nih.gov/pubmed/35907932
http://dx.doi.org/10.1038/s41598-022-16957-y