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Enhancement of fatigue resistance by recrystallization and grain growth to eliminate bonding interfaces in Cu–Cu joints
Cu–Cu joints have been adopted for ultra-high density of packaging for high-end devices. However, cracks may form and propagate along the bonding interfaces during fatigue tests. In this study, Cu–Cu joints were fabricated at 300 °C by bonding 〈111〉-oriented nanotwinned Cu microbumps with 30 μm in d...
Autores principales: | Ong, Jia-Juen, Tran, Dinh-Phuc, Lan, Man-Chi, Shie, Kai-Cheng, Hsu, Po-Ning, Tsou, Nien‑Ti, Chen, Chih |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2022
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9338952/ https://www.ncbi.nlm.nih.gov/pubmed/35907932 http://dx.doi.org/10.1038/s41598-022-16957-y |
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