Direct measurement of surface photovoltage by AC bias Kelvin probe force microscopy

Surface photovoltage (SPV) measurements are a crucial way of investigating optoelectronic and photocatalytic semiconductors. The local SPV is generally measured consecutively by Kelvin probe force microscopy (KPFM) in darkness and under illumination, in which thermal drift degrades spatial and energ...

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Detalles Bibliográficos
Autores principales: Miyazaki, Masato, Sugawara, Yasuhiro, Li, Yan Jun
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Beilstein-Institut 2022
Materias:
Full Research Paper
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9344549/
https://www.ncbi.nlm.nih.gov/pubmed/35957676
http://dx.doi.org/10.3762/bjnano.13.63

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9344549/
https://www.ncbi.nlm.nih.gov/pubmed/35957676
http://dx.doi.org/10.3762/bjnano.13.63

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