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Direct measurement of surface photovoltage by AC bias Kelvin probe force microscopy
Surface photovoltage (SPV) measurements are a crucial way of investigating optoelectronic and photocatalytic semiconductors. The local SPV is generally measured consecutively by Kelvin probe force microscopy (KPFM) in darkness and under illumination, in which thermal drift degrades spatial and energ...
Autores principales: | , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Beilstein-Institut
2022
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9344549/ https://www.ncbi.nlm.nih.gov/pubmed/35957676 http://dx.doi.org/10.3762/bjnano.13.63 |
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author | Miyazaki, Masato Sugawara, Yasuhiro Li, Yan Jun |
author_facet | Miyazaki, Masato Sugawara, Yasuhiro Li, Yan Jun |
author_sort | Miyazaki, Masato |
collection | PubMed |
description | Surface photovoltage (SPV) measurements are a crucial way of investigating optoelectronic and photocatalytic semiconductors. The local SPV is generally measured consecutively by Kelvin probe force microscopy (KPFM) in darkness and under illumination, in which thermal drift degrades spatial and energy resolutions. In this study, we propose the method of AC bias Kelvin probe force microscopy (AC-KPFM), which controls the AC bias to nullify the modulated signal. We succeeded in directly measuring the local SPV by AC-KPFM with higher resolution, thanks to the exclusion of the thermal drift. We found that AC-KPFM can achieve a SPV response faster by about one to eight orders of magnitude than classical KPFM. Moreover, AC-KPFM is applicable in both amplitude modulation and frequency modulation mode. Thus, it contributes to advancing SPV measurements in various environments, such as vacuum, air, and liquids. This method can be utilized for direct measurements of changes in surface potential induced by modulated external disturbances. |
format | Online Article Text |
id | pubmed-9344549 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2022 |
publisher | Beilstein-Institut |
record_format | MEDLINE/PubMed |
spelling | pubmed-93445492022-08-10 Direct measurement of surface photovoltage by AC bias Kelvin probe force microscopy Miyazaki, Masato Sugawara, Yasuhiro Li, Yan Jun Beilstein J Nanotechnol Full Research Paper Surface photovoltage (SPV) measurements are a crucial way of investigating optoelectronic and photocatalytic semiconductors. The local SPV is generally measured consecutively by Kelvin probe force microscopy (KPFM) in darkness and under illumination, in which thermal drift degrades spatial and energy resolutions. In this study, we propose the method of AC bias Kelvin probe force microscopy (AC-KPFM), which controls the AC bias to nullify the modulated signal. We succeeded in directly measuring the local SPV by AC-KPFM with higher resolution, thanks to the exclusion of the thermal drift. We found that AC-KPFM can achieve a SPV response faster by about one to eight orders of magnitude than classical KPFM. Moreover, AC-KPFM is applicable in both amplitude modulation and frequency modulation mode. Thus, it contributes to advancing SPV measurements in various environments, such as vacuum, air, and liquids. This method can be utilized for direct measurements of changes in surface potential induced by modulated external disturbances. Beilstein-Institut 2022-07-25 /pmc/articles/PMC9344549/ /pubmed/35957676 http://dx.doi.org/10.3762/bjnano.13.63 Text en Copyright © 2022, Miyazaki et al. https://creativecommons.org/licenses/by/4.0/This is an open access article licensed under the terms of the Beilstein-Institut Open Access License Agreement (https://www.beilstein-journals.org/bjnano/terms/terms), which is identical to the Creative Commons Attribution 4.0 International License (https://creativecommons.org/licenses/by/4.0 (https://creativecommons.org/licenses/by/4.0/) ). The reuse of material under this license requires that the author(s), source and license are credited. Third-party material in this article could be subject to other licenses (typically indicated in the credit line), and in this case, users are required to obtain permission from the license holder to reuse the material. |
spellingShingle | Full Research Paper Miyazaki, Masato Sugawara, Yasuhiro Li, Yan Jun Direct measurement of surface photovoltage by AC bias Kelvin probe force microscopy |
title | Direct measurement of surface photovoltage by AC bias Kelvin probe force microscopy |
title_full | Direct measurement of surface photovoltage by AC bias Kelvin probe force microscopy |
title_fullStr | Direct measurement of surface photovoltage by AC bias Kelvin probe force microscopy |
title_full_unstemmed | Direct measurement of surface photovoltage by AC bias Kelvin probe force microscopy |
title_short | Direct measurement of surface photovoltage by AC bias Kelvin probe force microscopy |
title_sort | direct measurement of surface photovoltage by ac bias kelvin probe force microscopy |
topic | Full Research Paper |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9344549/ https://www.ncbi.nlm.nih.gov/pubmed/35957676 http://dx.doi.org/10.3762/bjnano.13.63 |
work_keys_str_mv | AT miyazakimasato directmeasurementofsurfacephotovoltagebyacbiaskelvinprobeforcemicroscopy AT sugawarayasuhiro directmeasurementofsurfacephotovoltagebyacbiaskelvinprobeforcemicroscopy AT liyanjun directmeasurementofsurfacephotovoltagebyacbiaskelvinprobeforcemicroscopy |