Preparation of hybrid samples for scanning electron microscopy (SEM) coupled to focused ion beam (FIB) analysis: A new way to study cell adhesion to titanium implant surfaces

The study of the intimate connection occurring at the interface between cells and titanium implant surfaces is a major challenge for dental materials scientists. Indeed, several imaging techniques have been developed and optimized in the last decades, but an optimal method has not been described yet...

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Detalles Bibliográficos
Autores principales: Parisi, Ludovica, Toffoli, Andrea, Ghezzi, Benedetta, Lagonegro, Paola, Trevisi, Giovanna, Macaluso, Guido M.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Public Library of Science 2022
Materias:
Lab Protocol
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9345346/
https://www.ncbi.nlm.nih.gov/pubmed/35917303
http://dx.doi.org/10.1371/journal.pone.0272486

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9345346/
https://www.ncbi.nlm.nih.gov/pubmed/35917303
http://dx.doi.org/10.1371/journal.pone.0272486

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