Brittle fracture studied by ultra-high-speed synchrotron X-ray diffraction imaging

In situ investigations of cracks propagating at up to 2.5 km s(−1) along an (001) plane of a silicon single crystal are reported, using X-ray diffraction megahertz imaging with intense and time-structured synchrotron radiation. The studied system is based on the Smart Cut process, where a buried lay...

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Detalles Bibliográficos
Autores principales: Petit, Antoine, Pokam, Sylvia, Mazen, Frederic, Tardif, Samuel, Landru, Didier, Kononchuk, Oleg, Ben Mohamed, Nadia, Olbinado, Margie P., Rack, Alexander, Rieutord, Francois
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2022
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9348878/
https://www.ncbi.nlm.nih.gov/pubmed/35974730
http://dx.doi.org/10.1107/S1600576722006537

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9348878/
https://www.ncbi.nlm.nih.gov/pubmed/35974730
http://dx.doi.org/10.1107/S1600576722006537

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