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Brittle fracture studied by ultra-high-speed synchrotron X-ray diffraction imaging
In situ investigations of cracks propagating at up to 2.5 km s(−1) along an (001) plane of a silicon single crystal are reported, using X-ray diffraction megahertz imaging with intense and time-structured synchrotron radiation. The studied system is based on the Smart Cut process, where a buried lay...
| Autores principales: | , , , , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
International Union of Crystallography
2022
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9348878/ https://www.ncbi.nlm.nih.gov/pubmed/35974730 http://dx.doi.org/10.1107/S1600576722006537 |