Electron diffraction characterization of nanocrystalline materials using a Rietveld-based approach. Part I. Methodology

Transmission electron microscopy is a powerful experimental tool, very effective for the complete characterization of nanocrystalline materials by employing a combination of imaging, spectroscopy and diffraction techniques. Electron powder diffraction (EPD) pattern fingerprinting in association with...

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Detalles Bibliográficos
Autores principales: Sinha, Ankur, Bortolotti, Mauro, Ischia, Gloria, Lutterotti, Luca, Gialanella, Stefano
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2022
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9348886/
https://www.ncbi.nlm.nih.gov/pubmed/35974734
http://dx.doi.org/10.1107/S1600576722006367

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9348886/
https://www.ncbi.nlm.nih.gov/pubmed/35974734
http://dx.doi.org/10.1107/S1600576722006367

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