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Electron diffraction characterization of nanocrystalline materials using a Rietveld-based approach. Part I. Methodology

Transmission electron microscopy is a powerful experimental tool, very effective for the complete characterization of nanocrystalline materials by employing a combination of imaging, spectroscopy and diffraction techniques. Electron powder diffraction (EPD) pattern fingerprinting in association with...

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Detalles Bibliográficos
Autores principales:	Sinha, Ankur, Bortolotti, Mauro, Ischia, Gloria, Lutterotti, Luca, Gialanella, Stefano
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	International Union of Crystallography 2022
Materias:	Research Papers
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9348886/ https://www.ncbi.nlm.nih.gov/pubmed/35974734 http://dx.doi.org/10.1107/S1600576722006367

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