Magnetic Sector Secondary Ion Mass Spectrometry on FIB-SEM Instruments for Nanoscale Chemical Imaging

[Image: see text] The structural, morphological, and chemical characterization of samples is of utmost importance for a large number of scientific fields. Furthermore, this characterization very often needs to be performed in three dimensions and at length scales down to the nanometer. Therefore, th...

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Detalles Bibliográficos
Autores principales: De Castro, Olivier, Audinot, Jean-Nicolas, Hoang, Hung Quang, Coulbary, Chérif, Bouton, Olivier, Barrahma, Rachid, Ost, Alexander, Stoffels, Charlotte, Jiao, Chengge, Dutka, Mikhail, Geryk, Michal, Wirtz, Tom
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2022
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9352148/
https://www.ncbi.nlm.nih.gov/pubmed/35862487
http://dx.doi.org/10.1021/acs.analchem.2c01410

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9352148/
https://www.ncbi.nlm.nih.gov/pubmed/35862487
http://dx.doi.org/10.1021/acs.analchem.2c01410

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