Cargando…

Magnetic Sector Secondary Ion Mass Spectrometry on FIB-SEM Instruments for Nanoscale Chemical Imaging

[Image: see text] The structural, morphological, and chemical characterization of samples is of utmost importance for a large number of scientific fields. Furthermore, this characterization very often needs to be performed in three dimensions and at length scales down to the nanometer. Therefore, th...

Descripción completa

Detalles Bibliográficos
Autores principales: De Castro, Olivier, Audinot, Jean-Nicolas, Hoang, Hung Quang, Coulbary, Chérif, Bouton, Olivier, Barrahma, Rachid, Ost, Alexander, Stoffels, Charlotte, Jiao, Chengge, Dutka, Mikhail, Geryk, Michal, Wirtz, Tom
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2022
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9352148/
https://www.ncbi.nlm.nih.gov/pubmed/35862487
http://dx.doi.org/10.1021/acs.analchem.2c01410

Ejemplares similares