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Phase contrast imaging with inelastically scattered electrons from any layer of a thick specimen
A controversy exists as to whether the signal in a high resolution phase contrast electron micrograph of a particle in a thick specimen is the same irrespective of the particle’s position along the beam axis. Different conceptions of inelastic scattering and its effects on wave interference have led...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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Elsevier
2022
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9355894/ https://www.ncbi.nlm.nih.gov/pubmed/35367902 http://dx.doi.org/10.1016/j.ultramic.2022.113511 |