Advanced preparation of plan-view specimens on a MEMS chip for in situ TEM heating experiments

In situ transmission electron microscopy (TEM) is a powerful tool for advanced material characterization. It allows real-time observation of structural evolution at the atomic level while applying different stimuli such as heat. However, the validity of analysis strongly depends on the quality of th...

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Detalles Bibliográficos
Autores principales: Minenkov, Alexey, Šantić, Natalija, Truglas, Tia, Aberl, Johannes, Vukušić, Lada, Brehm, Moritz, Groiss, Heiko
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer International Publishing 2022
Materias:
Impact Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9365753/
https://www.ncbi.nlm.nih.gov/pubmed/35968543
http://dx.doi.org/10.1557/s43577-021-00255-5

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9365753/
https://www.ncbi.nlm.nih.gov/pubmed/35968543
http://dx.doi.org/10.1557/s43577-021-00255-5

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