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Advanced preparation of plan-view specimens on a MEMS chip for in situ TEM heating experiments
In situ transmission electron microscopy (TEM) is a powerful tool for advanced material characterization. It allows real-time observation of structural evolution at the atomic level while applying different stimuli such as heat. However, the validity of analysis strongly depends on the quality of th...
| Autores principales: | , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Springer International Publishing
2022
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9365753/ https://www.ncbi.nlm.nih.gov/pubmed/35968543 http://dx.doi.org/10.1557/s43577-021-00255-5 |