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Influence of the Electron Beam and the Choice of Heating Membrane on the Evolution of Si Nanowires’ Morphology in In Situ TEM

We used in situ transmission electron microscopy (TEM) to observe the dynamic changes of Si nanowires under electron beam irradiation. We found evidence of structural evolutions under TEM observation due to a combination of electron beam and thermal effects. Two types of heating holders were used: a...

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Detalles Bibliográficos
Autores principales: Shen, Ya, Zhao, Xuechun, Gong, Ruiling, Ngo, Eric, Maurice, Jean-Luc, Roca i Cabarrocas, Pere, Chen, Wanghua
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2022
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9369465/
https://www.ncbi.nlm.nih.gov/pubmed/35955179
http://dx.doi.org/10.3390/ma15155244