Thickness Effect on the Solid-State Reaction of a Ni/GaAs System

Ni thin films with different thicknesses were grown on a GaAs substrate using the magnetron sputtering technique followed by in situ X-ray diffraction (XRD) annealing in order to study the solid-state reaction between Ni and GaAs substrate. The thickness dependence on the formation of the intermetal...

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Detalles Bibliográficos
Autores principales: Rabhi, Selma, Oueldna, Nouredine, Perrin-Pellegrino, Carine, Portavoce, Alain, Kalna, Karol, Benoudia, Mohamed Cherif, Hoummada, Khalid
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2022
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9370099/
https://www.ncbi.nlm.nih.gov/pubmed/35957063
http://dx.doi.org/10.3390/nano12152633

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9370099/
https://www.ncbi.nlm.nih.gov/pubmed/35957063
http://dx.doi.org/10.3390/nano12152633

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