In Situ Time-of-Flight Mass Spectrometry of Ionic Fragments Induced by Focused Electron Beam Irradiation: Investigation of Electron Driven Surface Chemistry inside an SEM under High Vacuum

Recent developments in nanoprinting using focused electron beams have created a need to develop analysis methods for the products of electron-induced fragmentation of different metalorganic compounds. The original approach used here is termed focused-electron-beam-induced mass spectrometry (FEBiMS)....

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Detalles Bibliográficos
Autores principales: Jurczyk, Jakub, Pillatsch, Lex, Berger, Luisa, Priebe, Agnieszka, Madajska, Katarzyna, Kapusta, Czesław, Szymańska, Iwona B., Michler, Johann, Utke, Ivo
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2022
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9370286/
https://www.ncbi.nlm.nih.gov/pubmed/35957140
http://dx.doi.org/10.3390/nano12152710

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9370286/
https://www.ncbi.nlm.nih.gov/pubmed/35957140
http://dx.doi.org/10.3390/nano12152710

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