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Modeling and X-ray Analysis of Defect Nanoclusters Formation in B(4)C under Ion Irradiation
In the presented work, B(4)C was irradiated with xenon swift heavy ions at the energy of 167 MeV. The irradiation of the substrate was done at room temperature to a fluence of 3.83 × 10(14) ion/cm(2). The samples were then analyzed with the X-ray diffraction technique to study the structural modific...
Autores principales: | , , , , , , , , , , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2022
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9370675/ https://www.ncbi.nlm.nih.gov/pubmed/35957074 http://dx.doi.org/10.3390/nano12152644 |