Hyperelastic Microcantilever AFM: Efficient Detection Mechanism Based on Principal Parametric Resonance

The impetus of writing this paper is to propose an efficient detection mechanism to scan the surface profile of a micro-sample using cantilever-based atomic force microscopy (AFM), operating in non-contact mode. In order to implement this scheme, the principal parametric resonance characteristics of...

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Detalles Bibliográficos
Autores principales: Alibakhshi, Amin, Rahmanian, Sasan, Dastjerdi, Shahriar, Malikan, Mohammad, Karami, Behrouz, Akgöz, Bekir, Civalek, Ömer
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2022
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9370785/
https://www.ncbi.nlm.nih.gov/pubmed/35957026
http://dx.doi.org/10.3390/nano12152598

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9370785/
https://www.ncbi.nlm.nih.gov/pubmed/35957026
http://dx.doi.org/10.3390/nano12152598

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