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High frequency resistive switching behavior of amorphous TiO(2) and NiO
Resistive switching (RS) of Transition Metal Oxides (TMOs) has become not only an attractive choice for the development of next generation non-volatile memory, but also as a suitable family of materials capable of supporting high-frequency and high-speed switching needed for the next generation wire...
Autores principales: | Bulja, Senad, Kopf, Rose, Tate, Al, Cappuzzo, Mark, Kozlov, Dmitry, Claussen, Holger, Wiegner, Dirk, Templ, Wolfgang, Mirshekar-Syahkal, Dariush |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2022
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9376065/ https://www.ncbi.nlm.nih.gov/pubmed/35963936 http://dx.doi.org/10.1038/s41598-022-16907-8 |
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